Spectroscopic Ellipsometry

Spectroscopic Ellipsometry, Hiroyuki  Fujiwara audiobook. ISDN43589739

Hiroyuki Fujiwara

Genre:technical literature

Language:English

Type:PDF book

Publisher:John Wiley & Sons Limited

Publication date:08.12.2022

Price:$297.90

Views:33

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

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