Atomic Force Microscopy. Understanding Basic Modes and Advanced Applications

Atomic Force Microscopy. Understanding Basic Modes and Advanced Applications, Greg  Haugstad audiobook. ISDN31232217

Greg Haugstad

Genre:foreign educational literature

Language:English

Type:PDF book

Publisher:John Wiley & Sons Limited

Publication date:08.12.2022

Price:$193.20

Views:44

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

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